The Equipment of the Microscopy Laboratories
Combined scanning probe and optical microscopy equipment
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NT-MDT TERS (Tip-Enhanced Raman Spectroscopy) – Raman + Photoluminescence system Solar II with 2 water-cooled cameras (covering 320–1700 nm), 4 automatized gratings, confocal imaging, wide range scanning table – SPM module NTegra Spectra with sample scanner for AFM or STM tips and tuning forks, top and side laser input – Lasers: dual He-Cd NUV/blue (15 mW @ 325 nm, 40 mW @ 441 nm), green solid state (20 mW @ 532 nm), NIR diode laser (300 mW @ 785 nm), supercontinuum ("white laser" Fianium SC-450) covering 400–1600 nm.
core facility |
Scanning probe microscopy equipment
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Veeco scanning probe microscope – modes: C-AFM, NC-AFM, IC-AFM, LFM, STM – maximal lateral scan: 90 micrometers – maximal vertical scan: 7.5 micrometers |
Optical microscopy equipment
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Industrial microscope Zeiss – working regimes: transmission, reflection, bright field, dark field – Nomarski contrast, polarization regime in transmission |
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Microscope Peraval – interference microscope working in transmission – investigation of structures induced by variation of refractive index and sample thickness |
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Microscope Epival – interference microscope working in reflection – investigation of surface structures – vertical resolution up to 10 nm |
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Metalographic microscope Reichert – working in reflection regime – simultanous observation by eye and detection on photographic materials |
