Publications in 1995
- Darhuber, A.A. - Holý, Václav. Crystalline and Quasi-cristalline Patterns in X-Ray Diffraction from Periodic Arrays of Quantum Dots. Europhysics Letters, 32(1995), 2s. 131-136. 1995,. info
- Janča, Jan - Kryštof, P. - Navrátil, Karel - Bochníček, Zdeněk - Němec, Petr. Deposition and characterization of organosilicon thin films from TEOS+O2 gas mixture. Acta Physica Univesitatis Comenianae, Bratislava, 36, 5s. 57-57. ISSN 80-22306460. 1995,. info
- Janča, Jan - Navrátil, Karel - Bochníček, Zdeněk - Peřina, V. Depozice a charakterizace organosilikonových tenkých vrstev ze směsi TEOS+O2. Czechoslovak Journal of Physics, Praha : Academia, 45, 10s. 851-862. ISSN 0011-4626. 1995,. info
- Janča, Jan - Navrátil, Karel - Bochníček, Zdeněk. Depozice a charakterizace tenkých vrstev připravených ze směsi TEOS+O2 ve vf plazmatu. In 17th Symp. on Plasma Physics and Technology. Praha : ČVUT, 1995,. s. 275-277. ISBN 80-010-1344-8. info
- Koppensteiner, E. - Holý, Václav. Determination of threading dislocation density in hetero-epitaxial layers by diffuse x-ray scattering. J. Phys. D: Appl. Phys., 28, -s. 334-340. 1995,. info
- Holý, Václav. Diffuse x-ray scattering from misfit dislocations in SiGe epitaxial layers with graded Ge content. J. Appl. Phys., 78(1995), 8s. 5013-5033. 1995,. info
- Holý, Václav - Kuběna, Josef. Effect of interfacial-roughness replication on the diffuse x-ray reflection from periodical multilayers. Appl. Phys. A, 1995, 60s. 93-96. 1995,. info
- Holý, Václav. Elastic strains in GaAs/AlAs quantum dots studied by high-resolution x-ray diffraction. Physical Review B, USA : The American Physical Society, 52(1995), 11s. 8348-8404. ISSN 0163-1829. 1995,. info
- Humlíček, Josef - Bočánek, Luděk - Navrátil, Karel - Pánek, Petr - Švehla, Radoslav. Excition-polariton edge of GaAs: MBE layers between multiple-quantum-well structures. Solid State Communications, UK : Elsevier Science, 93(1995), 9s. 725-728. ISSN 0038-1098. 1995,. info
- Baumbach, G.T. - Holý, Václav v. Grazing-incidence diffraction from multilayers. Physical Review B, USA : The American Physical Society, 51(1995), 23s. 16848-16906. ISSN 0163-1829. 1995,. info
- Bochníček, Zdeněk - Holý, Václav - Wolf, G. - Stanzl, H. - Gebhardt, J. High Resolution x-ray diffractometry of ZnTe layers at elevated temperatures. Journal of Applied Physics, 78, 2s. 862-867. ISSN 0021-8979. 1995,. info
- Holý, Václav. Interface roughness in surface-sensitive x-ray methods. J. Phys. D: Appl. Phys., 28, -s. 253-257. 1995,. info
- Jergel, M. - Holý, Václav. Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction. J. Phys. D: Appl. Phys., 28, -s. 258-262. 1995,. info
- Li, J.H. - Holý, Václav. Investigation of strain relaxation of Ge 1-x Si x epilayers on Ge (001) by high-resolution x-ray reciprocal space mapping. Semicond. Sci. Technol., UK : Publishing Ltd, 10, -s. 1621-1628. ISSN 0268-1242. 1995,. info
- Handlířová, Blanka - Holý, Václav - Humlíček, Josef - Musilová, Jana - Pánek, Petr - Vižďa, František. Konzultační cvičení II. Brno : Masarykova univerzita v Brně, 1995,. 86 s. ISBN 80-210-1289-7. info
- Humlíček, Josef. Optical functions of the relaxed SiGe alloy and influence of strain. In Silicon Germanium. London, UK : University of Stuttgart, Germany, 1995,. s. 121-131. INSPEC. ISBN 0-85296-826-4. info
- Humlíček, Josef. Optical spectroscopy of SiGe. In Silicon Germanium. London, UK : University of Stuttgart, Germany, 1995,. s. 116-120. INSPEC. ISBN 0-85296-826-4. info
- Pánek, Petr - Munzar, Dominik - Humlíček, Josef - Lukeš, František. Photoreflectance Study of a Fibonacci Superlattice. physica status solidi (b), Berlin : J. Wiley, 190(1995), 1995s. 579-586. ISSN 0370-1972. 1995,. info
- Ohlídal, Ivan - Navrátil, Karel - Ohlídal, Miloslav. Scattering of Light from Multilayer Systems with Rough Boundaries. In Progress in Optics, Vol. 34 (Ed. E. Wolf). Amsterdam : Elsevier, 1995,. s. 249-331. ISBN 0 444 82140 6. info
- Mikulík, Petr. Scattering on aperiodic superlattices. In Beyond Quasicrystals. Les Ulis : Les Editions de Physique, 1995,. s. 229-247. URL info
- Li, J.H. - Holý, Václav. Strain relaxation and misfit dislocations in compositionally graded Si 1-x Ge x layers on Si (001). Journal of Crystal Growth, 1995, 157s. 137-141. 1995,. info
- Willatzen, M. - Lew Yan Voon, L. C. - Santos, P. V. - Cardona, M. - Munzar, Dominik - Christensen, Niels Egede. Theoretical study of band-edge states in Sn 1 Ge n strained-yer superlattices. Physical Review B, USA : The American Physical Society, 52(1995), 7s. 5070-5081. ISSN 0163-1829. 1995,. info
- Mikulík, Petr - Holý, Václav - Kuběna, Josef. X-ray diffraction on Fibonacci superlattices. Acta Crystallographica A, 51, 9999s. 825-830. 1995,. URL info
Output from Information System of the Masaryk University filtered for the following staff of the Institute: Luděk Bočánek, Ondřej Caha, Jan Celý, Adam Dubroka, Jan Fikar, Olga Fikarová Zrzavecká, Jan Hlávka, Václav Holý, Jaroslav Hora, Josef Humlíček, Jiří Chaloupka, Pavel Klang, Jan Krčmář, Vlastimil Křápek, Josef Kuběna, Assja Kučírková, Michal Lorenc, Jiří Marek, Přemysl Maršík, Mojmír Meduňa, Petr Mikulík, Dominik Munzar, Karel Navrátil, Alois Nebojsa, Jiří Novák, Petr Pánek, Radek Pavelka, Pavel Polouček, Eduard Schmidt, Jan Šik, Richard Štoudek, Radoslav Švehla