Publications in 1999
- Munzar, Dominik - Bernhard, C. - Golnik, A. - Humlíček, Josef - Cardona, M. A New Interpretation of the Phonon Anomalies in the Far-Infrared c-Axis Conductivity of Underdoped YBa2Cu30y. Phys. Stat. Sol. (b), Berlin : Wiley-VCH, 215(1999), -s. 557-561. 1999,. info
- Munzar, Dominik - Bernhard, C. - Golnik, A. - Humlíček, Josef - Cardona, M. Anomalies of the infrared-active phonons in underdoped YBa2Cu30y as evidence for the intra-bilayer Josephson effect. Solid state communications, Velká Britanie : Pergamon, (112)1999, -s. 365-369. ISSN 0038-1098. 1999,. info
- Franta, Daniel - Ohlídal, Ivan - Munzar, Dominik - Hora, Jaroslav - Navrátil, Karel - Manfredotti, Claudio - Fizzotti, Franco - Vittone, Ettore. Complete optical characterization of imperfect hydrogenated amorphous silicon layers by spectroscopic ellipsometry and spectroscopic reflectometry. Thin Solid Films, Oxford, UK : Elsevier science, 343-344, 1s. 295-298. ISSN 0040-6090. 1999,. URL info
- Zajíčková, Lenka - Eliáš, Marek - Buršíková, Vilma - Janča, Jan - Lorenc, Michal. Deposition of CNx Films in Inductively Coupled RF Discharge. In Proceedings of ICPIG XXIV. 1999. vyd. Warszaw : Institute of Plasma Phycics and Laser Miscofusion, 1999,. s. 41-42. info
- Holý, Václav. Diffuse x-ray reflection from multilayers with rough interfaces. Journal of Materials Science: Materials in Electronics, Great Britain : Kluwer Academic Publishers, (10)1999, -s. 223-226. ISSN 0957-4522. 1999,. info
- Grim, Jan - Holý, Václav - Kuběna, Josef - Stangl, J. - Darhuber, A.A. - Zerlauth, S. - Schäffler, F. - Bauer, G. Diffuse x-ray reflectivity of strain-compensated Si/SiGe/SiC multilayers. Semicond. Sci. Technol., Velká Britanie : IOP Publishing Ltd, 32(1999), -, od s. A216, 4 s. ISSN 0268-1242. 1999,. info
- Munzar, Dominik - Bernhard, C. - Cardona, M. Does the peak in the magnetic susceptibility determine the in-plane infrared conductivity of YBCO? A theoretical study. Physica C, Holland : Elsevier, (312)1999, -s. 121-135. ISSN 0921-4534. 1999,. info
- Bernhard, C. - Munzar, Dominik - Wittlin, A. - Konig, W. - Golnik, A. - Lin, C.T. Far-infrared ellipsometric study of the spectral gap in the c-axis conductivity of Y(1-x)Ca(x)Ba(2)Cu(3)O(7-d) crystals. Physical Review B, USA : The American Physical Society, 59(1999), 10, od s. R6631, 4 s. ISSN 0163-1829. 1999,. info
- Stangl, J. - Holý, Václav - Darhuber, A.A. - Mikulík, Petr - Bauer, G. - Zhu, J. - Brunner, K. - Abstreiter, G. High-resolution x-ray diffraction on self-organized step bunches of Si1-xGex grown on (113)-oriented Si. J. Phys. D: Appl. Phys., Velká Britanie : IOP Publishing LTd, 32, 9999, od s. A71, 4 s. ISSN 0022-3727. 1999,. info
- Holý, Václav - Pietsch, U. - Baumbach, T. High-resolution x-ray scattering from thin films and multilayers. Berlin, Heidelberg, New York : Springer-Verlag, 1999,. 256 s. Springer Tracts in Modern Physics. ISBN 3-540-62029-X. info
- Holý, Václav - Pietsch, U. - Baumbach, T. High-Resolution X-Ray Scattering From Thin Films and Multilayers. Berlin, Heidelberg, New York : Springer Tracts in Modern Physics, 1999,. 256 s. Springer-Verlag. info
- Eliáš, Marek - Zajíčková, Lenka - Buršíková, Vilma - Janča, Jan - Lorenc, Michal. Characterization of Composite Carbon Nitride Films Prepared by the Inductively Coupled RF Plasma. In Proceedings of 14th International Symposium on Plasma Chemistry. Prague (Czech Rep.) : Institute of Plasma Physics AV CR, 1999,. s. 1561-1566. Vol. III. ISBN 80-902724-3-6. info
- Humlíček, Josef. Infrared Spectroscopy of LiF on Ag and Si. Phys.stat.sol.(b), Germany, 215(1999), -s. 155-159. 1999,. info
- Holý, Václav - Stangl, J. - Zerlauth, S. - Bauer, G. - Darowski, N. - Lübbert, D. - Petsch, U. Lateral arrangement of self-assembled quantum dots in an SiGe/Si supertattice. Semicond. Sci. Technol., Velká Britanie : IOP Publishing Ltd, 32(1999), -, od s. A234, 5 s. ISSN 0268-1242. 1999,. info
- Lorenc, Michal - Šik, Jan - Nebojsa, Alois - Navrátil, Karel - Humlíček, Josef - Vorliček, V. - Hulicius, E. Optical characterisation of a thick MOVPE InSb film on GaAs. In Workshop proceedings EW MOVPE VIII. Prague : Institute of Physics ASCR, CR, 1999,. s. 369-372. ISBN 80-238-3551-3. info
- Navrátil, Karel - Šik, Jan - Humlíček, Josef - Nešpůrek, S. Optical properties of thin films of poly(methyl-phenylsilylene). Optical Materials, Amsterdam : Elsevier, 1999, 12s. 105-113. ISSN 0925-3467. 1999,. info
- Munzar, Dominik - Bernhard, C. - Golnik, A. - Humlíček, Josef - Cardona, M. Phonon Anomalies in the Far-Infrared c-Axis Conductivity of Underdoped YBa2Cu30y as evidence for the intra-bilayer Josephson effect. Journal of Low Temperature Physics, USA : Plenum Publishing Corporation, 117(1999), 5/6s. 1049-1053. ISSN 0022-2291. 1999,. info
- Munzar, Dominik - Bernhard, C. - Cardona, M. Possible relationship between the peak in the magnetic susceptibility and the in-plane far-infrared conductivity of YBCO. Physica C, Holland : Elsevier, 317-318, -s. 547-549. ISSN 0921-4534. 1999,. info
- Stangl, J. - Holý, Václav - Mikulík, Petr - Bauer, G. - Kegel, I. - Metzger, T.H. - Schmidt, O.G. - Lange, C. - Eberl, K. Self-assembled carbon-induced germanium quantum dots studied by grazing-incidence small-angle x-ray scattering. Applied Physics Letters, USA : American Institute of Physics, 74, -s. 3785-3787. ISSN 0003-6951. 1999,. info
- Bauer, G. - Darhuber, A.A. - Holý, Václav. Self-assembled Germanium-dot multilayers embedded in Silicon. Cryst. Res. Technol., Linz : IFH, 34(1999), 2s. 197-209. 1999,. info
- Holý, Václav - Springholz, G. - Pinczolits, M. - Bauer, G. Strain Induced Vertical and Lateral Correlations in Quantum Dot Superlattices. Physical Review Letters, USA : The Americal Physical Society, 83(1999), 2s. 356-359. ISSN 0031-9007. 1999,. info
- Zhuang, Y. - Holý, Václav - Stangl, J. - Darhuber, A.A. - Mikulík, Petr - Zerlauth, S. - Schäffler, F. - Bauer, G. - Darowski, N. - Lübbert, D. - Pietsch, U. Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction. J. Phys. D: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 32, 9999, od s. A224, 6 s. ISSN 0022-3727. 1999,. URL info
- Jergel, M. - Mikulík, Petr - Majková, E. - Luby, Š. - Senderák, R. - Pinčík, E. - Brunel, M. - Hudek, P. - Kostič, I. - Konečníková, A. Structural characterization of a lamellar W/Si multilayer grating. J. Appl. Phys., USA : American Institute of Physics, 85, 2s. 1225-1227. ISSN 0021-8979. 1999,. URL info
- Jergel, M. - Mikulík, Petr - Majková, E. - Luby, Š. - Senderák, R. - Pinčík, E. - Brunel, M. - Kostič, I. - Konečníková, A. Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy. J. Phys. D: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 32, 9999, od s. A220, 4 s. ISSN 0022-3727. 1999,. URL info
- Litzman, Otto - Mikulík, Petr. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J.Phys.: Condens. Matter, Velká Britanie : IOP Publishing Ltd, 11, 9999s. 5767-5779. ISSN 0953-8984. 1999,. URL info
- Litzman, Otto - Mikulík, Petr. The crystal truncation rod scattering of neutrons and the multiwave dynamical theory of diffraction. J. Phys. Condens. Matter, IOP Publishing Ltd, 11, 30s. 5767-5779. ISSN 0953-8984. 1999,. info
- Bernhard, C. - Munzar, Dominik - Klaser, M. - Wolf, Th. - Lin, C.T. - Cardona, M. The electronic c-axis conductivity of Y(1-x)Ca(x)Ba(2)Cu(3)O(7-d) single crystals studied by far-infrared ellipsometry. Physica C, Holland : Elsevier, 317-318, -s. 276-281. ISSN 0921-4534. 1999,. info
- Golnik, A. - Bernhard, Ch. - Humlíček, Josef - Klaeser, M. - Cardona, M. The far-infrared in-plane conductiivity of YBaCuO studied by ellipsometry. physics status solidi (b), 215, 1s. 553-556. 1999,. info
- Bochníček, Zdeněk - Vávra, Ivo - Holý, Václav. Thermal stability of amorphous Nb/Si multilayers studied by x-ray reflection. Bulletin Krystalografické společnosti Materials Structure, 6, 1s. 57-57. ISSN 1211-5895. 1999,. info
- Zhuang, Y. - Stangl, J. - Darhuber, A.A. - Bauer, G. - Mikulík, Petr - Holý, Václav - Darowski, N, - Pietsch, U. X-ray diffraction from quantum wires and quantum dots. Journal of Materials Science: Materials in Electronics, Great Britain : Kluwer Academic Publishers, (10)1999, -s. 215-221. ISSN 0957-4522. 1999,. info
- Mikulík, Petr - Baumbach, T. X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering. Phys. Rev. B, USA : The American Phys. Society, 59, 11s. 7632-7643. ISSN 0163-1829. 1999,. URL info
- Grim, Jan - Holý, Václav - Kuběna, Josef - Darhuber, A.A. - Zerlauth, S. - Bauer, G. X-ray reflection from self-organized interfaces in an SiGe/Si multilayer. Semicond. Sci. Technol., Velká Britanie : IOP Publishing Ltd, 14(1999), -s. 32-40. ISSN 0268-1242. 1999,. info
- Baumbach, Tilo - Mikulík, Petr. X-Ray Reflectivity by Rough Multilayers. In X-Ray and Neutron Reflectivity: Principles and Applications. Berlin : Springer, 1999,. s. 232-280. Lecture Notes in Physics: 58. ISBN 0940-7677. URL info
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