UFKL
pevné látky   biofyzika                 
Náš ústav se účastní projektu

CEITEC

Středoevropský technologický institut
  Ústavy fyziky jsou součástí Přírodovědecké fakulty Masarykovy univerzity v Brně. Cesky   English  

Publications in 2001

  1. Zelezny, V. - Tajima, S. - Munzar, D. - Motohashi, T. - Shimoyama, J. - Kishio, K. Anomalies in the infrared spectra of underdoped Bi2Sr2CaCu2Oz as evidence for the intrabilayer Josephson effect. Physical Review B, USA : American Physical Society, 63(2001), -, od s. 060502-1, 4 s. ISSN 0163-1829. 2001,. info

  2. Kudrle, Vít - Tálský, Antonín - Vašina, Petr - Křápek, Vlastimil - Janča, Jan. Atomic nitrogen concentration in afterglow measured by EPR and NO titration methods. In Proceedings of XXVth ICPIG. Nagoya : ICPIG, 2001,. s. 231-232. 4. info

  3. Sobota, Jaroslav - Bochníček, Zdeněk - Holý, Václav - Sorensen, G. - Jensen, H. C-N/MeN nanocomposite coatings, deposition and testing of performance. Surface and coating technology, New York : ELSEVIER, 142, 142s. 590-595. ISSN 0257-8972. 2001,. info

  4. Ohlídal, Ivan - Franta, Daniel - Frumar, Miroslav - Jedelský, Jaroslav - Navrátil, Karel. Complete Optical Analysis of Amorphous As-S Chalcogenide Thin Films by the Combined Spectrophotometric Method. Journal of Optoelectronics and Advanced Materials, Bucharest : INOE & INFM, 3, 4s. 873-878. ISSN 1454-4164. 2001,. URL info

  5. Mikulík, Petr - Jergel, M. - Baumbach, T. - Majková, E. - Pinčík, E. - Luby, Š. - Ortega, L. - Tucoulou, R. - Hudek, P. - Kostič, I. Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings. J. Phys. D: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10A, od s. A188, 5 s. ISSN 0022-3727. 2001,. URL info

  6. Munzar, Dominik - Bernhard, Christian - Holden, Todd - Golnik, Andrzej - Humlíček, Josef - Cardona, Manuel. Correlation between the Josephson coupling energy and the condensation energy in bilayer cuprate superconductors. Physical Review B, USA : American Physical Society, 64(2001), -, od s. 024523-1, 14 s. ISSN 0163-1829. 2001,. info

  7. Janča, Marek - Kudrle, Vít - Křápek, Vlastimil - Tálský, Antonín - Janča, Jan. Determination of rate constant of N+HMDSZ gas phase chemical reaction by means of EPR. In SAPP 13th Symposium Proceedings. Bratislava : MFF UK, 2001,. s. 100-101. ISBN 80-223-1573-7. info

  8. Ohlídal, Ivan - Franta, Daniel - Ohlídal, Miloslav - Navrátil, Karel. Determination of Thicknesses and Spectral Dependences of Refractive Indices of Non-Absorbing and Weakly Absorbing Thin Films Using the Wavelengths Related to Extrema in Spectral Reflectances. Vacuum, USA : ELSEVIER (PERGAMON), 61, 1, od s. 285-289, 5 s. ISSN 0042-207X. 2001,. URL info

  9. Anopchenko, A. - Jergel, M. - Majkova, E. - Holy, V. Effect of substrate heating and ion beam polishing on the interface quality in Mo/Si multilayers - X-ray comparative study. Physica B, Amsterdam : Elsevier Science, 305, 1s. 14-20. ISSN 0921-4526/00. 2001,. info

  10. Daniel, A.; - Holý, Václav - Zhuang, Y. - Roch, T. - Grenzer, J. - Bochníček, Zdeněk - Bauer, G. GID study of strains in Si due to patterned SiO2. J. Phys. D: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10A, od s. A197, 6 s. ISSN 0022-3727. 2001,. info

  11. Daniel, A. - Holý, Václav - Bauer, G. GID study of strains in Si due to patterned SiO2. J. Phys.D.: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10As. 197-202. ISSN 0022-3727. 2001,. info

  12. Holy, V. - Roch, T. - Stangl, J. - Bauer, G. Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires. Phys. Rev. B, USA : The American Phys. Society, 63, 20s. 5318-5327. ISSN 0163-1829. 2001,. info

  13. Holy, V. - Stangl, J. - Springholz, G. - Bauer, G. High-resolution x-ray diffraction from self-organized PbSe/PbEuTe quantum dot superlattices. J. Phys.D.: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10As. 1-5. ISSN 0022-3727. 2001,. info

  14. Sobota, Jaroslav - Sorensen, G. - Jensen, H. - Bochníček, Zdeněk - Holý, Václav. Nanocomposite Coatings Used as Hard Solid Lubricants. In Proceedings of the International Conference on Metalurgical Coatings and Thin Films. San Diego, California : MRS, 2001,. s. 1-1. info

  15. Ohlídal, Ivan - Franta, Daniel - Ohlídal, Miloslav - Navrátil, Karel. Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances. Applied Optics, USA : Optical Society of America, 40, 31s. 5711-5717. ISSN 0003-6935. 2001,. URL info

  16. Tajima, S. - Zelezny, V. - Motohashi, T. - Shimoyama, J. - Kishio, K. - Munzar, D. Optical response of the Josephson coupled CuO2-layers in high-Tc superconductors. Physica C, Holland : Elsevier, 362(2001), -s. 86-91. ISSN 0921-4534. 2001,. info

  17. Stangl, J. - Daniel, A. - Holy, V. Strain and composition distribution in uncapped SiGe islands from x-ray diffraction. Applied Physics Letters, USA : American Institute of Physics, 79, 10s. 1474-1476. ISSN 0003-6951. 2001,. info

  18. Roch, T. - Holy, V. Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle x-ray scattering. physica status solidi (b), Berlin : J. Wiley, 224, 1s. 241-245. 2001,. info

  19. Roch, T. - Holý, Václav - Stangl, J. Structural investigations on self-organized Si/SiGe islands by grazing incidence small angle X-ray scattering. physica status solidi (b), Berlin : J. Wiley, 224, 1s. 241-245. ISSN 0370-1972. 2001,. info

  20. Kang, H.H. - Springholz, G. - Holy, V. - Bauer, G. TEM investigation of self-organized PbSe quantum dots as a function of spacer layer thickness and growth temperature. Materials Science and Engineering, Lausanne : ELSEVIER SCIENCE SA, 80, 1-3s. 104-108. ISSN 0921-5107. 2001,. info

  21. Springholz, G. - Pinczolits, M. - Holý, Václav - Zerlauth, S. - Vavra, I. - Bauer, G. Vertical and lateral ordering in self-organized quantum dot superlattices. Physica E, Amsterdam : Elsevier Science, 2001, 9s. 149-162. ISSN 1386-9477. 2001,. info

  22. Li, J.H. - Holý, Václav - Zhong, Z. - Kulik, J. - Moss, S.C. - Norman, A.G. - Mascarenhas, A. - Reno, J.L. - Follstaedt, D.M. X-ray analysis of spontaneous lateral modulation in InAs/AlAs short-period superlattices. Appl. Phys. Lett., USA : Institute of Physics, 2001, 78s. 219-220. ISSN 0003-6951. 2001,. info

  23. Ulyanenkov, A. - Inaba, K. - Mikulík, Petr - Darowski, N. - Omote, K. - Grenzer, J. - Forchel, A. X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires. J. Phys. D: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10A, od s. A179, 4 s. ISSN 0022-3727. 2001,. URL info

  24. Li, J. H. - Kulik, J. - Holy, V. X-ray diffraction from CuPt-ordered III-V ternary semiconductor alloy films. Phys. Rev. B, USA : The American Phys. Society, 63, 15s. 5310-5316. ISSN 0163-1829. 2001,. info

  25. Polouček, Pavel - Pietsch, U. - Geue, T. - Symietz, C. - Brezesinski, G. X-ray reflectivity analysis of thin complex Langmuir-Blodgett films. Journal of physics D: Applied physics, Bristol, England : IOP Publishing Ltd., 34, 4, od s. 450-458, 9 s. ISSN 0022-3727. 2001,. info

  26. Meduňa, Mojmír - Holy, V. - Roch, T. - Bauer, G. X-ray reflectivity from self-assembled structures in Ge/Si superlattices. J. Phys.D.: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10As. 193-196. ISSN 0022-3727. 2001,. info

  27. Meduňa, Mojmír - Holý, Václav - Roch, T. X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy. Journal of Applied Physics, USA : American institute of physics, 89, 9s. 4836-4842. ISSN 0021-8979. 2001,. info

  28. Jergel, M. - Falcony, C. - Mikulík, Petr - Ortega, L. - Majková, E. - Pinčík, E. - Luby, Š. - Kostič, I. - Hudek, P. X-ray reflectivity study of a W/Si multilayer grating. Superficies y Vacío, Mexico : Sociedad Mexicana de Ciencia de Superfic, 2001, 13s. 10-14. ISSN 1665-3521. 2001,. URL info

  29. Roch, T. - Holy, V. - Meduňa, Mojmír - Bauer, G. X-ray studies on self-organized wires in SiGe/Si multilayers. J. Phys.D.: Appl. Phys., Velká Britanie : IOP Publishing Ltd, 34, 10As. 6-10. ISSN 0022-3727. 2001,. info

  30. Zhong, Z. - Holy, V. - Li, J.H. X-ray study of antiphase boundaries in the quadruple-period ordered GaAs0.87Sb0.13 alloy. Journal of Applied Physics, USA : American institute of physics, 90, 2s. 644-649. ISSN 0021-8979. 2001,. info

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(c) Ústav fyziky kondenzovaných látek                             publ-year-2001.shtml změněn 04.12.2006