UFKL
pevné látky   biofyzika                 
Náš ústav se účastní projektu

CEITEC

Středoevropský technologický institut
  Ústavy fyziky jsou součástí Přírodovědecké fakulty Masarykovy univerzity v Brně. Cesky   English  

Publications in 2004

  1. Novák, Jiří - Holý, Václav - Stangl, Julian - Bauer, Günther - Wintensberger, Eugen - Kiravittaya, Suwit - Schmidt, Oliver G. A method for the charcterization of strain fields in burid quantum dots using X-ray standing waves. Journal of physics D: Applied physics, Bristol, England : IOP Publishing Ltd., 38, 10A, od s. A137-A142, 6 s. ISSN 0022-3727. 2004,. Journal of Physics D: Applied Physics, 38 info

  2. Meduňa, Mojmír - Novák, Jiří - Holý, Václav - Bauer, Günther - Falub, Claudiu - Tsujino, Soichiro - Müller, Elisabeth - Grützmacher, Detlev - Campidelli, Yves - Kermarrec, Olivier - Bensahel, Daniel. Annealing studies of high Ge composition Si/SiGe multilayers. Zeitschrift fur Kristalographie, R. Oldenbourg Verlag GmbH, 219, 4, od s. 195-200, 6 s. ISSN 0044-2968. 2004,. info

  3. Bernhard, Christian - Humlíček, Josef. Anomalous oxygen-isotope effect on the in-plane far-infrared conductivity of detwinned (YBa2Cu3O6.9)-O-16,18. Physical Review B, USA : The American Physical Society, 69, 5, od s. 2502-4, 4 s. ISSN 0163-1829. 2004,. info

  4. Klapetek, Petr - Ohlídal, Ivan - Navrátil, Karel. Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation. Microchimica Acta, Wien : Springer-Verlag, 147, 3, od s. 175-180, 6 s. ISSN 0026-3672. 2004,. info

  5. Hartmanová, Marie - Navrátil, Vladislav - Navrátil, Karel - Jergel, Marian - Gmucova, Kateřina - Gandarilla, Fjod Alexandrovič - Zemek, Jan - Chromik, Sergej - Kundracik, František. Correlation between microscopic and macroscopic properties of yttria-stabilized zirconia thin films. In Physics and Technology of Thin Films IWTF 2003. I. Teheran, Iran : World Scientific, 2004,. od s. 158-168, 11 s. info

  6. Humlíček, Josef - Bernhard, Christian. Diffraction effects in infrared ellipsometry of conducting samples. Thin Solid Films, Oxford : Elsevier, 455-456, 1, od s. 177-182, 6 s. ISSN 0040-6090. 2004,. info

  7. Křápek, Vlastimil - Fikar, Jan - Humlíček, Josef. Electronic Structure and Optical Properties of InAs/GaAs Quantum Dots. In WDS'04 Proceedings of contributed papers. Praha : MFF UK, 2004,. od s. 469-474, 6 s. ISBN 80-86732-32-0. info

  8. Fikar, Jan - Coupeau, Christophe - Kruml, Tomáš - Bonneville, Joel. Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion. Materials Science and Engineering A, Netherland, 387-389, 1, od s. 926-930, 5 s. ISSN 0921-5093. 2004,. info

  9. Bernhard, Christian - Humlíček, Josef - Keimer, Bernhard. Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors. Thin Solid Films, Oxford : Elsevier, 455-456, 1, od s. 143-149, 7 s. ISSN 0040-6090. 2004,. info

  10. Holý, Václav - Daniš, Stanislav - Bauer, Guenther - Zhong, Zhenyang. High-resolution diffuse x-ray scattering from threading dislocations in heteroepitaxial layers. Applied Physics Letters, 85, 7, od s. 3065-3067, 3 s. ISSN 0003-6951. 2004,. info

  11. Holý, Václav - Pietsch, Ullrich - Baumbach, Tilo. High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures. New York, Berlin, Heidelberg : Springer, 2004,. 408 s. Advanced Texts in Physics. ISBN 0387400923. info

  12. Čechal, Jan - Tichopádek, Petr - Nebojsa, Alois - Bonaventurová Zrzavecká, Olga - Urbánek, Michal - Spousta, Jiří - Navrátil, Karel - Šikola, Tomáš. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis, USA : John Wiley & Sons, 2004, 36, od s. 1218-1221, 4 s. ISSN 0142-2421. 2004,. info

  13. Brandejsová, Eva - Čechal, Jan - Bonaventurová Zrzavecká, Olga - Nebojsa, Alois - Tichopádek, Petr - Urbánek, Michal - Navrátil, Karel - Šikola, Tomáš - Humlíček, Josef. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika, Přerov : Physical Institute, ASCR, 9/2004, 9, od s. 260-262, 3 s. ISSN 0447-6441. 2004,. info

  14. Štoudek, Richard - Humlíček, Josef. Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon. In WDS'04 Proceedings of Contributed Papers. Praha, Česká republika : MATFYZPRESS, 2004,. od s. 475-479, 4 s. ISBN 80-86732-32-0. info

  15. Štoudek, Richard - Lorenc, Michal - Humlíček, Josef. Infrared Absorption Spectroscopy of Oxygen Precipitates in Nitrogen-doped Czochralski Silicon. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. Rožnov pod Radhoštěm, Česká republika : TECON Scientific, s.r.o., 2004,. od s. 146-150, 5 s. info

  16. Dubroka, Adam - Cristiani, G. - Habermeier, H.-U. - Humlíček, Josef. Infrared study of YBa2Cu3O7/La0.67Ca0.33MnO3 superlattices. Thin Solid Films, Oxford, UK : Elsevier science, 2004, 455, od s. 172-176, 5 s. ISSN 0040-6090. 2004,. info

  17. Celý, Jan. Kvazičástice v pevných látkách. Brno : Vutium, 2004,. 224 s. Není součástí žádné ediční řady. ISBN 80-214-2611-X. info

  18. Fikar, Jan - Schaller, Robert - Baluc, Nadine. Mechanical spectroscopy of Al-Cu-Fe quasicrystalline coatings. Materials Science and Engineering A, Netherland, 370, 1-2, od s. 524-530, 7 s. ISSN 0921-5093. 2004,. info

  19. Fikar, Jan - Schaller, Robert - Baluc, Nadine. Mechanical spectroscopy of decagonal Al-Cu-Fe-Cr quasicrystalline coatings. Philosophical Magazine, ABINGDON OX14 4RN, OXON, ENGLAND : TAYLOR & FRANCIS LTD, 84, 33, od s. 3571-3584, 14 s. ISSN 1478-6435. 2004,. info

  20. Köhler, B. - Schreiber, J. - Bendjus, B. - Herms, M. - Melov, V. - Helfen, L. - Mikulík, Petr - Baumbach, T. Micro- and nano-NDE in the laboratory for acoustic diagnosis and quality assurance. Proceedings of SPIE: Testing, Reliability, and Application of Micro- and Nano-Material Systems II, USA : SPIE, 5392, 1, od s. 63-77, 15 s. ISSN 0-8194-5309-9. 2004,. URL info

  21. Holý, Václav. Ordering parameters of self-organized three-dimensional quantum-dot lattices determined from anomalous x-ray diffraction. Appl. Phys. Lett., USA : Institute of Physics, 84, 6, od s. 885-887, 3 s. ISSN 0003-6951. 2004,. info

  22. Dubroka, Adam - Munzar, Dominik. Phonon anomalies in trilayer high-Tc cuprate superconductors. Physica C, Holland : Elsevier, 405, May, od s. 133-147, 15 s. ISSN 0921-4534. 2004,. info

  23. Mikulík, Petr. Project of a clean room laboratory for silicon device technology at the Masaryk University. In Proceedings of International Conference Silicon-2004. Rožnov pod Radhoštěm : Karel Vojtěchovský, 2004,. od s. 54-55, 2 s. info

  24. Holden, Todd - Humlíček, Josef. Proximity induced metal-insulator transition in YBa2Cu3O7/La2/3Ca1/3MnO3 superlattices. Physical Review B, USA : The American Physical Society, 69, 6, od s. 4505 1-7, 7 s. ISSN 0163-1829. 2004,. info

  25. Holý, Václav. Shape and composition change of Ge dots due to Si capping. Applied Surface Science, USA : ELSEVIER (NORTH-HOLLAND), 224, 2, od s. 139-142, 4 s. ISSN 0169-4332. 2004,. info

  26. Holý, Václav - Stangl, Julian - Bauer, Guenther. Structural properties of self-organized semiconductor nanostructures. Review of Moder Physics, 76, 4, od s. 725-779, 55 s. ISSN 0036-6861. 2004,. info

  27. Baumbach, T. - Helfen, L. - Mikulík, Petr - Dehn, F. Synchrotron-radiation X-ray tomography: a method for 3D imaging of cement microstructure and its evolution during hydration. In Proceedings of XIV. International Symposium SANACE 2004. Brno : Sdružení pro sanace betonových konstrukcí, 2004,. od s. 71-80, 10 s. ISBN 0021-8898. URL info

  28. Bonaventurová Zrzavecká, Olga - Nebojsa, Alois - Navrátil, Karel - Nešpůrek, Stanislav - Humlíček, Josef. Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane). Thin Solid Films, Elsevier, 455/2004, may, od s. 278-282, 5 s. ISSN 0040-6090. 2004,. info

  29. Caha, Ondřej - Křápek, Vlastimil - Holý, Václav - Moss, S. - Li, J. - Norman, A. - Mascarenhas, A. - Reno, J. - Stangl, J. - Meduňa, Mojmír. X-ray diffraction on laterally modulated (InAs)n/(AlAs)m short-period superlattices. Journal of Applied Physics, USA : American Institute of Physics, 96, 9s. 4833-4838. ISSN 0021-8979. 2004,. info

  30. Klang, Pavel - Holý, Václav - Štoudek, Richard - Šik, Jan. X-ray Diffuse Scattering from Defects in Nitrogen-doped Czochralski Grown Silicon Wafers. In Proceedings of The Ninth Scientific and Business Conference SILICON 2004. 2004. vyd. Rožnov pod Radhoštěm, Česká republika : TECON Scientific, s.r.o., 2004,. s. 53-53. info

  31. Holý, Václav. 3D hexagonal versus trigonal ordering in self-organized PbSe quantum dot superlattices. Physica E, Amsterdam : Elsevier Science, 21, 11, od s. 611-614, 4 s. ISSN 1386-9477. 2004,. info

Output from Information System of the Masaryk University filtered for the following staff of the Institute: Luděk Bočánek, Ondřej Caha, Jan Celý, Adam Dubroka, Jan Fikar, Olga Fikarová Zrzavecká, Jan Hlávka, Václav Holý, Jaroslav Hora, Josef Humlíček, Jiří Chaloupka, Pavel Klang, Jan Krčmář, Vlastimil Křápek, Josef Kuběna, Assja Kučírková, Michal Lorenc, Jiří Marek, Přemysl Maršík, Mojmír Meduňa, Petr Mikulík, Dominik Munzar, Karel Navrátil, Alois Nebojsa, Jiří Novák, Petr Pánek, Radek Pavelka, Pavel Polouček, Eduard Schmidt, Jan Šik, Richard Štoudek, Radoslav Švehla  

(c) Ústav fyziky kondenzovaných látek                             publ-year-2004.shtml změněn 04.12.2006