1. - 4. October 1997
Smolenice castle, Slovakia
| 15:00 | Metin Tolan (tutorial) : X-ray reflectometry |
| 15.45 - 16.00 BREAK | |
| 16:00 | Samolienko: On the statistical interpretation of x-ray reflectivity data fitting |
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16:20 | Bolm: X-ray reflectivity and GID from organic multilayers |
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16:40 | Fulthorpe: X-ray reflectivity studies of sputtered Cu/Co multilayers on etched silicon |
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17:00 | Stangl: X-ray reflectivity from Si/Si/Ge/SiC superlattices |
| 17:20 - 17.40 BREAK | |
| 17:40 | Safronov: LB films of three-component random copolymers with chromophore groups and study by X-ray diffraction |
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18:00 | Nefedov: High resolution X-ray scattering of thin Pt films on Sapphire |
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18:20 | Eisenschmidt: Reflectometry at Bi/Ti layers |
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19:00 | DINNER |
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20:00 | GET-TOGETHER PARTY |
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7:45 | BREAKFAST |
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8:30 | Ullrich Pietsch (tutorial) : High-resolution X-ray diffraction |
| 9.15 - 9.30 BREAK | |
| 9:30 | Thiele: Reciprocal space mapping of Si/Ge multiquantum wells |
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9:50 | Zeimer: High-resolution XRD from buried SQW |
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10:10 | Schaefer: Determination of the deformation tensor of ZnSe epilayers pseudomorphically grown on misoriented GaAs substrate |
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10:30 | Dynowska: Strain relaxation of CdTe/CdMnTe and CdTe/MnTe superlattices grown by MBE on GaAs (100) |
| 11.10 - 11.30 BREAK |
| 11:30 | ourek: High resolution X-ray diffraction by III-V semiconductor layers |
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11:50 | Korn: Characterization of ZnSTe/ZnTe superlattices |
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12:10 | Gerhard: Comparison of superlattices based on ZnSTe and BeTe |
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12:30 | Haratuyunyan: X-ray diffraction investigation of the relaxation state in strained GaInAs/GaAs multilayer structures |
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13:00 | LUNCH |
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15:30 | Juergen Haertwig (tutorial) : X-ray topography |
| 16.15 - 16.30 BREAK | |
| 16:30 | Ludwig: X-ray topographic analysis of dislocations in thin SIMOX layers |
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16:50 | Markov: Surface demages revealing in chemical-mechanical polished silicon wafers by X-ray grazing incidence topography and TEM |
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17:10 | Kinne: Image platess as detectors in high-resolution X-ray diffraction |
| 17:30 - 17:50 BREAK | |
| 17:50 | Ress: Utilization of image plates for high resolution X-ray diffraction |
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18:10 | Eichhorn: X-ray characterization of Si implanted with MeV Ge ions |
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18:30 | Poloucek: X-ray reflectivity from DNA monolayers |
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19:00 | DINNER |
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20:00 | Leszcynski: Microstructure of GaN surface, epilayers and bulk crystals |
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20:20 | Mazur: X-ray high resolution diffraction study of the mechanical treatment related defects |
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20:40 | Nesterents: X-ray diffraction from superlattices with microdefects and layer thickness fluctuations |
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21:00 | WINE PARTY |
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Friday 3. 10. 1997
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7:45 | BREAKFAST |
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8:30 | Tim Salditt (tutorial) : X-ray diffuse scattering |
| 9:15 - 9:30 BREAK | |
| 9:30 | Neumann: X-ray magnetic circulr dichrosim studies from modulated specular reflectivity |
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9:50 | Beck: Structural characterization of duried delta layers in Si(100) by non-specular reflectivity and reciprocal space mapping |
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10:10 | Grim: Diffuse reflectivity of strain compensated Si/SiGe multilayers |
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10:30 | Valvoda: Quantitative comparison of structural parameters of magnetic multilayers obtained by diffraction methods and by direct imaging techniques |
| 10:50 - 11:10 BREAK | |
| 11:10 | Veldkamp: Two dimensional scanning diffractometry for gradient optics investigation |
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11:30 | Loehmann: Structure of sputtered molybdenum in single layers and multilayers with silicon |
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11:50 | Grenzer: High-resolution XRD and X-ray diffuse scattering from semiconductor multilayers |
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12:10 | Bak-Misiuk: Influence of hydrostatic pressure on transformation AlGaAs/GaAs interface |
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12.30 | Domagala: Methodology of lattice parameter measurements for bent crystals |
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13:00 | LUNCH |
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15:30 | Sergey Stepanov (tutorial) : X-ray grazing incidence diffraction |
| 16:15 - 16:30 BREAK | |
| 16:30 | Ulyanenkov: Grazing incidence x-ray diffraction from multilayers in view of diffuse scattering from rough interfaces |
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16:50 | Sauer: Ti diffusion in LiNbO3 characterized by useing X-ray grazing incidence diffraction |
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17:10 | Kovats: Huang scattering under grazing incidence from pseudomorphic SiC layers on Si |
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17:50 | Kondrashkina: High-resolution diffraction and grazing incidence X-ray scattering from InGaP/GaAs multilayers |
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18:10 | Fanchenko: Some aspects of grazing-incidence diffraction from crystals inhomogeneous films |
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18:30 | Clarke: Asymmetries in grazing incidence diffuse X-ray scattering |
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18:50 | Schroer: Three beam interferences on layered systems |
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20:00 | FIRE PARTY |
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7:45 | BREAKFAST |
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8:30 | Tilo Baumbach (tutorial) : X-ray diffraction from structurized surfaces |
| 9:15 - 9:30 BREAK |
| 9:30 | Mikulik: X-ray reflectivity from multilayer gratings |
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9:50 | Zhuang: Diffraction and reflectivity studies on Si/SiGe reactive ion etched periodic wire and dot structures |
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10:10 | Darhuber: X-ray diffraction and reflection from self assembeled quantum dots |
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10:30 | Luebbert: Determination of relaxation effects in semiconductor heterostructures by X-ray grazing incidence diffraction |
| 10:50 - 11:10 BREAK | |
| 11:10 | Ponti: Strain investigation in semiconductor epitaxial lateral structures |
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11:30 | Darowski: X-ray grazing incidence diffraction from buried quantum wires |
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11:50 | Wiebach: Strain in Si(1-x)Gex islands on silicon investigated by x-ray diffraction |
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12:10 | Kharchenko: Influence of secondary extinction on X-ray diffraction from nonuniform crystals with microdefects |
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12:30 | Sozonov: Photoemmission excited by the interference X-ray wave field for structural characterization of surface layers and thin films |
| 13:00 | LUNCH |
END OF THE MEETING