Seminář ÚFE: dr. Michal Pavera

Zveme Vás na přednášku dr. Michala Pavery z firmy Nenovision s.r.o.

Material characterization by SPM microscopy

Scanning probe microscopy (SPM) is a set of microscopy techniques designed to examine surfaces and layers with very high resolution down to the atomic level. This talk will focus on a basic description of the SPM technique. The basic principle of measurement and the methods of detection of the measurement signal will be briefly described. The basic technical design of the microscope and the most common applications will be outlined.