Summer School of Vacuum Technology 2023
29 May – 1 June 2023
- Pension Medard, Boží Dar 49E, 363 01
The Czech Vacuum Society cordially invites you to the Summer School of Vacuum Technology 2023. The date is set from May 29th, 2023, to June 1st, 2023, and it will be held in Boží Dar in Czech Ore Mountains.
This year's topics are Methods of Material Research in Laboratory and Industrial Environment. The school is available even to newcomers in the field. Traditionally, the summer school will hold a company partner evening. For more information about this year's summer school, look at the Czech Vacuum Society webpage. The complete invitation with all detailed information is available in PDF.
The application deadline is May 12th, 2023. Registration fee includes school fee, lodging, and meals. For individuals, the price is set from 900 to 1 700 CZK.
• Michal Procházka a Ján Minár, NTC, University of West Bohemia, Plzeň: Introduction to the photoelectron spectroscopy
• Karel Mašek, Faculty of Mathematics and Physics, Charles University, Praha: Surface analyses using synchrotron-radiation XPS and RHEED
• Edyta Beyer, SOLARIS, Jagiellonian University, Krakow, Poland: X-ray Spectroscopy Methods at the SOLARIS Synchrotron
• Daniel Franta, Faculty of Science, Masaryk Univerzity, Brno: Optical characterization of thin films using elipsometry and spectrophotometry
• Pavla Roupcová, IPM CAS, Brno and STI, Brno Technical University, Brno: Thin film analysis using Mössbauer spectroscopy
• Michaela Vašinová Galliová, Faculty of Chemistry, Brno Technical University and BIC, Brno: Material analysis using laser ablation witch ICP and mass spectrometry
• Stanislav Haviar, Physics Department and NTIS, University of West Bohemia, Plzeň: EDS and WDS analyses: Principles, understanding and what to be aware of, basic introduction into Raman spectroscopy
• Jiří Tuček, HVM Plasma spol. s r.o., Praha: Spectroscopic method for the study of thin films and surfaces
• Ondřej Zindulka, SHM s.r.o., Šumperk: Mechanical properties of thin wear-resistant films and their measurement