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Publications

Look for an updated list here: ResearcherID: E-2474-2012

  • M. Meduna, V. Holý, T. Roch, J. Stangl, G. Bauer, J. Zhu, K. Brunner, and G. Abstreiter, X-ray reflectivity of self-assembled structures in SiGe multilayers and comparison with atomic force microscopy, J. Appl. Phys. 89 , 4836 (2001)

  • M. Meduna, V. Holý, T. Roch, G. Bauer, O. G. Schmidt, and K. Eberl, X-ray reflectivity from self-assembled structures in Ge/Si superlattices, J. Phys. D: Appl. Phys. 34 , A193 (2001)

  • T. Roch, V. Holý, A. Daniel, E. Höflinger, M. Meduna, T.H. Metzger, G. Bauer, J. Zhu, K. Brunner, and G. Abstreiter, X-ray studies on self-organized wires in SiGe/Si multilayers, J. Phys. D: Appl. Phys. 34 , A6 (2001)

  • M. Meduna, V. Holý, T. Roch, G. Bauer, O. G. Schmidt, and K. Eberl, Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices, Semicond. Sci. Technol. 17 , 480 (2002)

  • T. Roch, M. Meduna, J. Stangl, A. Hesse, R.T. Lechner, G. Bauer, G. Dehlinger, L. Diehl, U. Gennser, E. Müller, D. Grützmacher, Interface roughness in SiGe quantum-cascade structures from x-ray reflectivity studies, J. Appl. Phys. 91 , 8974 (2002)

  • M. Meduna, V. Holý, J. Stangl, A. Hesse, T. Roch, G. Bauer, O. G. Schmidt, and K. Eberl, Non-specular x-ray reflection from self-organized ripple structures in Si/Ge multilayers , Physica E 13 , 1003 (2002)

  • V. Holy, M. Meduna, J. Stangl, T. Roch, and G. Bauer, Investigation of Morphology and Chemical Composition of Self-Organized Semiconductor Quantum Dots and Wires by X-Ray Scattering, Acta Phys Pol A 102 , 7 (2002)

  • J. H. Li, V. Holý, M. Meduna, S. C. Moss, A. G. Norman, A. Mascarenhas, and J. L. Reno, Lateral composition modulation in (InAs)n/(AlAs)m short-period superlattices investigated by high-resolution x-ray scattering, Phys. Rev. B 66 , 115312 (2002)

  • M. Meduna, J. Novák, G. Bauer, V. Holý, C.V. Falub, S. Tsujino, E. Müller, D. Grützmacher, Y. Campidelli, O. Kermarrec, D. Bensahel, Annealing studies of high Ge composition SiGe/Si multilayers , Z. Kristallogr. 219 , 195 (2004)

  • O. Caha, V. Krapek, V. Holy, S.C. Moss, J.H. Li, A.G. Norman, A. Mascarenhas, J.L. Reno, J. Stangl, M. Meduna, X-ray diffraction on laterally modulated (InAs)(n)/(AlAs)(m) short-period superlattices , J. Appl. Phys. 96 , 4833 (2004)

  • D. Grützmacher, S. Tsujino, C.V. Falub, A. Borak, L. Diehl, E. Müller, H. Sigg, U. Gennser, T. Fromherz, M. Meduna, G. Bauer, J. Faist, O. Kermarrec, Transport and absorption in strain-compensated Si/Si1-xGex multiple quantum well and cascade structures deposited on Si0.5Ge0.5 pseudosubstrates , Mater. Sci. in Semi. Proc. 8 , 401 (2005)

  • H. Sigg, C.V. Falub, E. Müller, A. Borak, D. Grützmacher, T. Fromherz, M. Meduna, O. Kermarrec, Bandstructure analysis of strain compensated Si/SiGe quantum cascade structures, Optical Mater. 27 , 841 (2005)

  • M. Meduna, J. Novák, C.V. Falub, G. Chen, G. Bauer, S. Tsujino, D. Grützmacher, E. Müller, Y. Campidelli, O. Kermarrec, D. Bensahel, N. Schell, High temperature investigations of Si/SiGe based cascade structures using x-ray scattering methods, J. Phys. D: Appl. Phys. 38 , A121 (2005)

  • C.V. Falub, M. Meduna, E. Müller, S. Tsujino, A. Borak, H. Sigg, D. Grützmacher, T. Fromherz, and G. Bauer, Structural studies of strain-symmetrised Si/SiGe structures grown by molecular beam epitaxy, Journal of Crystal Growth 278 , 495 (2005)

  • T. Fromherz, M. Meduna, G. Bauer, A. Borak, C.V. Falub, S. Tsujino, H. Sigg, D. Grützmacher, Intersubband absorption of strain compensated, Si1-xGex valenceband quantum wells with 0.7<=x<=0.85 , J. Appl. Phys. 98 , 044501 (2005)